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HiSIM: Hiroshima-University STARC IGFET Model 最新の情報 2026/02/11 当センター元教員であり本学名誉教授の三浦道子先生とハンス マタウシュ先生が分担執筆された著書「The FET Centennial: Celebrating the Field-Effect Transistor」(Wiley-IEEE Press)が出版されます(2026年早期)。今日の半導体集積回路の礎となる電界効果トランジスタ(FET)百周年を祝して、世界有数の研究者らが分担執筆しています。 両先生は同著書 "10.
Details
Category: Education
hisim.hiroshima-u.ac.jpAI Visibility Breakdown
1
Structured Data
5
Content Structure
4
Entity Clarity
5
E-E-A-T Signals
5
Technical AEO
2
AI Discoverability
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Source & Attribution
Scored by Engagemii on June 2, 2026. Methodology: engagemii.com/aeo/methodology
Source URL: https://engagemii.com/aeo/brands/hisim-hiroshima-u-ac-jp
Cite this score: Engagemii (2026). "AEO Score for Top." Retrieved from https://engagemii.com/aeo/brands/hisim-hiroshima-u-ac-jp
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